DocumentCode :
3301509
Title :
Automatic insertion of fault-tolerant structures at the RT level
Author :
Entrena, Luis ; Lopez, Carlos ; Olías, Emilio
Author_Institution :
Electron. Technol. Area, Univ. Carlos III de Madrid, Spain
fYear :
2001
fDate :
2001
Firstpage :
48
Lastpage :
50
Abstract :
Historically, there has been a lack of CAD tools for the design of on-line testable circuits. As a consequence, the design of on-line testable circuits is currently being made manually to a large extent. In this paper we propose a new tool for the automatic insertion of fault-tolerant structures in an HDL synthesizable description of the design. With this tool, a fault-tolerant version of the design can be automatically produced according to the user specifications. The resulting fault-tolerant design is also described in an HDL and can be simulated and synthesized with commercial tools. Examples are shown to demonstrate the capabilities of this approach
Keywords :
cellular arrays; fault tolerant computing; hardware description languages; high level synthesis; integrated circuit design; redundancy; CAD tools; RT level; VHDL; automatic insertion; design productivity; fault-tolerant structures; on-line testable circuits; redundancy techniques; synthesizable description; Circuit faults; Circuit synthesis; Circuit testing; Design automation; Fault tolerance; Hardware design languages; Logic testing; Productivity; Redundancy; Safety;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Workshop, 2001. Proceedings. Seventh International
Conference_Location :
Taormina
Print_ISBN :
0-7695-1290-9
Type :
conf
DOI :
10.1109/OLT.2001.937817
Filename :
937817
Link To Document :
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