DocumentCode
3301681
Title
Combining model development with characterization
Author
Scharfetter, D. ; Duvall, S.
Author_Institution
Intel Corp., Santa Clara, CA, USA
fYear
1991
fDate
8-11 Dec. 1991
Firstpage
976
Lastpage
977
Abstract
The authors demonstrate the advantages of combining model characterization with model development and implementation. Examples cover process and device simulators, compact models for circuit simulators, and statistical models for design verification of IC devices. Situations in which combining model characterization with design could have avoided miscorrelations identified during design verification are discussed.<>
Keywords
integrated circuit technology; semiconductor device models; semiconductor process modelling; simulation; IC devices; circuit simulators; compact models; design verification; device simulators; model characterization; model development; process simulators; statistical models; Certification; Circuit simulation; Circuit testing; Design engineering; Educational institutions; Integrated circuit modeling; Manufacturing processes; Predictive models; Process design; Product design;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International
Conference_Location
Washington, DC, USA
ISSN
0163-1918
Print_ISBN
0-7803-0243-5
Type
conf
DOI
10.1109/IEDM.1991.235260
Filename
235260
Link To Document