Title :
Fault Dictionary Compaction By Output Sequence Removal
Author :
Boppana, Vamsi ; Fuchs, W. Kent
Keywords :
Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Compaction; Dictionaries; Frequency; Pins; Sequential circuits; Tires;
Conference_Titel :
Computer-Aided Design, 1994., IEEE/ACM International Conference on
Print_ISBN :
0-8186-3010-8
DOI :
10.1109/ICCAD.1994.629878
