• DocumentCode
    3301758
  • Title

    A new laser system for X-rays flashes sensitivity evaluation

  • Author

    Lewis, D. ; Lapuyade, H. ; Deval, Y. ; Maidon, Y. ; Darracq, F. ; Briand, R. ; Fouillat, P.

  • Author_Institution
    Bordeaux I Univ., Talence, France
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    111
  • Lastpage
    113
  • Abstract
    This paper describes a new methodology using an optical laser bench for ICs X-rays-flashes sensitivity evaluation. Application to the study of one hardening technique of a BandGap Reference circuit is presented
  • Keywords
    X-ray effects; integrated circuit testing; laser beam applications; radiation hardening (electronics); reference circuits; IC testing; X-ray flash sensitivity; bandgap reference circuit; optical laser bench; radiation hardening; Circuit testing; Laser beams; Laser modes; Laser noise; Optical pulse generation; Optical pulses; Optical surface waves; Radiation hardening; Semiconductor lasers; X-ray lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Workshop, 2001. Proceedings. Seventh International
  • Conference_Location
    Taormina
  • Print_ISBN
    0-7695-1290-9
  • Type

    conf

  • DOI
    10.1109/OLT.2001.937829
  • Filename
    937829
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3301758