Title :
A new laser system for X-rays flashes sensitivity evaluation
Author :
Lewis, D. ; Lapuyade, H. ; Deval, Y. ; Maidon, Y. ; Darracq, F. ; Briand, R. ; Fouillat, P.
Author_Institution :
Bordeaux I Univ., Talence, France
Abstract :
This paper describes a new methodology using an optical laser bench for ICs X-rays-flashes sensitivity evaluation. Application to the study of one hardening technique of a BandGap Reference circuit is presented
Keywords :
X-ray effects; integrated circuit testing; laser beam applications; radiation hardening (electronics); reference circuits; IC testing; X-ray flash sensitivity; bandgap reference circuit; optical laser bench; radiation hardening; Circuit testing; Laser beams; Laser modes; Laser noise; Optical pulse generation; Optical pulses; Optical surface waves; Radiation hardening; Semiconductor lasers; X-ray lasers;
Conference_Titel :
On-Line Testing Workshop, 2001. Proceedings. Seventh International
Conference_Location :
Taormina
Print_ISBN :
0-7695-1290-9
DOI :
10.1109/OLT.2001.937829
