DocumentCode :
3301771
Title :
Automatic Test Program Generation For Pipelined Processors
Author :
Iwashita, Hiroaki ; Kowatari, Satoshi ; Nakata, Tsuneo ; Hirose, Fumiyasu
fYear :
1994
fDate :
6-10 Nov 1994
Firstpage :
580
Lastpage :
583
Keywords :
Automatic programming; Automatic testing; Circuit simulation; Computational modeling; Formal verification; Hazards; Logic design; Logic testing; Microprocessors; Pipeline processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 1994., IEEE/ACM International Conference on
ISSN :
1063-6757
Print_ISBN :
0-8186-3010-8
Type :
conf
DOI :
10.1109/ICCAD.1994.629879
Filename :
629879
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3301771
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