DocumentCode :
3301779
Title :
InAlAs/InGaAs double heterojunction bipolar transistors with a collector launcher structure for high-speed ECL applications
Author :
Yamada, H. ; Futatsugi, T. ; Shigematsu, H. ; Tomioka, T. ; Fujii, T. ; Yokayama, N.
Author_Institution :
Fujitsu Laboratories Ltd., Atsugi, Japan
fYear :
1991
fDate :
8-11 Dec. 1991
Firstpage :
964
Lastpage :
966
Abstract :
The authors report the demonstration of high-speed ECL (emitter coupled logic) circuits using InAlAs/InGaAs double-heterojunction bipolar transistors (DHBTs). These DHBTs use a launcher structure in the collector to reduce the collector transit time. The DHBTs achieve the cutoff frequencies of f/sub T/=64 GHz and f/sub max/=54 GHz and hold a breakdown voltage about three times that of conventional InGaAs single-heterojunction bipolar transistors. A 1/4-frequency divider with bilevel ECL gates fabricated using these DHBTs operated at up to 11.9 GHz with a supply voltage of 3.5 V. The total power consumption was 255 mW. The novel collector structure produces high-speed and high-breakdown-voltage DHBTs, enabling high-speed digital applications of InGaAs-based HBTs.<>
Keywords :
III-V semiconductors; aluminium compounds; bipolar integrated circuits; electric breakdown of solids; emitter-coupled logic; frequency dividers; gallium arsenide; heterojunction bipolar transistors; indium compounds; integrated logic circuits; 1/4-frequency divider; 11.9 GHz; 255 mW; 3.5 V; 54 GHz; 64 GHz; DHBTs; HBT; InAlAs-InGaAs; bilevel ECL gates; collector launcher structure; double heterojunction bipolar transistors; emitter coupled logic; high-breakdown-voltage; high-speed ECL applications; high-speed digital applications; Circuits; Current density; Double heterojunction bipolar transistors; Energy consumption; Frequency conversion; Heterojunction bipolar transistors; Indium compounds; Indium gallium arsenide; Resistors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International
Conference_Location :
Washington, DC, USA
ISSN :
0163-1918
Print_ISBN :
0-7803-0243-5
Type :
conf
DOI :
10.1109/IEDM.1991.235264
Filename :
235264
Link To Document :
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