Title :
CMOS differential and absolute thermal sensors
Author :
Syal, Ashish ; Lee, Victor ; Andre, I. ; Altet, Josep
Author_Institution :
Dept. of Comput. & Electr. Eng., British Columbia Univ., Vancouver, BC, Canada
Abstract :
This paper treats the test of CMOS digital ICs by using the thermal mapping of the silicon surface as a test observable. Two different temperature-sensing strategies are presented. The novel sensors developed are an on-chip CMOS Differential Temperature (DT) sensor and a Proportional to Absolute Temperature (PTAT) sensor. The sensors are small, robust, effective, and operate without affecting the circuit performance. The sensors have been implemented in a standard .18 μm CMOS technology
Keywords :
CMOS digital integrated circuits; integrated circuit testing; temperature sensors; 0.18 micron; CMOS digital IC testing; Si; differential temperature sensor; proportional to absolute temperature sensor; silicon surface; thermal mapping; CMOS digital integrated circuits; CMOS technology; Circuit faults; Circuit testing; Integrated circuit testing; Semiconductor device measurement; Sensor phenomena and characterization; Temperature measurement; Temperature sensors; Thermal sensors;
Conference_Titel :
On-Line Testing Workshop, 2001. Proceedings. Seventh International
Conference_Location :
Taormina
Print_ISBN :
0-7695-1290-9
DOI :
10.1109/OLT.2001.937832
