DocumentCode
3301850
Title
On the design of self-testing checkers for modified Berger codes
Author
Piestrak, Stanislaw J. ; Bakalis, Dimitris ; Kavousianos, Xrysovalantis
Author_Institution
Inst. of Eng. Cybern., Tech. Univ. Wroclaw, Poland
fYear
2001
fDate
2001
Firstpage
153
Lastpage
157
Abstract
One of several approaches for designing highly-reliable systems relies on using error detecting codes (EDCs) and implementing digital circuits as self-checking. One class of EDCs that has been very often used to implement self-checking circuits are Berger codes. Although several self-testing checkers (STCs) for Berger codes have been proposed in the past, they mostly present area and delay results based on gate counts and gate levels and not on real implementations. In this work we consider real implementations and present and evaluate the area, delay and power characteristics of STCs for modified Berger codes that are based on: (a) parallel counters and (b) sorting networks. Preliminary results indicate that STCs based on parallel counters are smaller and consume less power than the STCs based on sorting networks
Keywords
automatic testing; counting circuits; error correction codes; integrated circuit design; integrated circuit testing; sorting; digital circuit design; error detecting code; modified Berger code; parallel counter; reliability; self-testing checker; sorting network; Aerodynamics; Aerospace electronics; Built-in self-test; CMOS logic circuits; Circuit faults; Circuit testing; Computer errors; Digital circuits; Power dissipation; Sorting;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Workshop, 2001. Proceedings. Seventh International
Conference_Location
Taormina
Print_ISBN
0-7695-1290-9
Type
conf
DOI
10.1109/OLT.2001.937835
Filename
937835
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