• DocumentCode
    3301850
  • Title

    On the design of self-testing checkers for modified Berger codes

  • Author

    Piestrak, Stanislaw J. ; Bakalis, Dimitris ; Kavousianos, Xrysovalantis

  • Author_Institution
    Inst. of Eng. Cybern., Tech. Univ. Wroclaw, Poland
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    153
  • Lastpage
    157
  • Abstract
    One of several approaches for designing highly-reliable systems relies on using error detecting codes (EDCs) and implementing digital circuits as self-checking. One class of EDCs that has been very often used to implement self-checking circuits are Berger codes. Although several self-testing checkers (STCs) for Berger codes have been proposed in the past, they mostly present area and delay results based on gate counts and gate levels and not on real implementations. In this work we consider real implementations and present and evaluate the area, delay and power characteristics of STCs for modified Berger codes that are based on: (a) parallel counters and (b) sorting networks. Preliminary results indicate that STCs based on parallel counters are smaller and consume less power than the STCs based on sorting networks
  • Keywords
    automatic testing; counting circuits; error correction codes; integrated circuit design; integrated circuit testing; sorting; digital circuit design; error detecting code; modified Berger code; parallel counter; reliability; self-testing checker; sorting network; Aerodynamics; Aerospace electronics; Built-in self-test; CMOS logic circuits; Circuit faults; Circuit testing; Computer errors; Digital circuits; Power dissipation; Sorting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Workshop, 2001. Proceedings. Seventh International
  • Conference_Location
    Taormina
  • Print_ISBN
    0-7695-1290-9
  • Type

    conf

  • DOI
    10.1109/OLT.2001.937835
  • Filename
    937835