Performance optimization of a fundamental millimeterwave VCO

A methodology for optimizing the performance of monolithic microwave integrated circuits (MMICs) has been developed and used successfully to improve yields and performance of a GaAs voltage-controlled oscillator (VCO). This methodology uses large amounts of data analysis and enables performance optimization information to be gathered on the same wafers from which production hardware is derived. The method focuses on the relationship between circuit performance and normal variations in specific fabrication-process steps. Improvements have been made without dramatically changing individual processes outside their normal parameter space, and have not required new photolithography masks. This has allowed significant improvements to chip performance without effecting production schedules or budgets and without developing new processes or circuit designs.