Title :
Effectiveness and limitations of various software techniques for "soft error" detection: a comparative study
Author :
Nicolescu, B. ; Velazco, R. ; Reorda, M. Sonza
Author_Institution :
TIMA Lab., Grenoble, France
Abstract :
Deals with different software based strategies allowing the on-line detection of bit flip errors arising in microprocessor-based digital architectures as the consequence of the interaction with radiation. Fault injection experiments put in evidence the detection capabilities and the limitations of each of the studied techniques
Keywords :
error detection; fault diagnosis; integrated circuit testing; microprocessor chips; radiation effects; transients; bit-flip errors; detection capabilities; fault injection experiments; microprocessor-based digital architectures; on-line detection; radiation effects; single event effects; soft error detection; software techniques; transient effects; CMOS technology; Circuit faults; Costs; Hardware; Integrated circuit technology; Manufacturing processes; Neutrons; Registers; Silicon on insulator technology; Single event transient;
Conference_Titel :
On-Line Testing Workshop, 2001. Proceedings. Seventh International
Conference_Location :
Taormina
Print_ISBN :
0-7695-1290-9
DOI :
10.1109/OLT.2001.937838
