DocumentCode
3301905
Title
Effectiveness and limitations of various software techniques for "soft error" detection: a comparative study
Author
Nicolescu, B. ; Velazco, R. ; Reorda, M. Sonza
Author_Institution
TIMA Lab., Grenoble, France
fYear
2001
fDate
2001
Firstpage
172
Lastpage
177
Abstract
Deals with different software based strategies allowing the on-line detection of bit flip errors arising in microprocessor-based digital architectures as the consequence of the interaction with radiation. Fault injection experiments put in evidence the detection capabilities and the limitations of each of the studied techniques
Keywords
error detection; fault diagnosis; integrated circuit testing; microprocessor chips; radiation effects; transients; bit-flip errors; detection capabilities; fault injection experiments; microprocessor-based digital architectures; on-line detection; radiation effects; single event effects; soft error detection; software techniques; transient effects; CMOS technology; Circuit faults; Costs; Hardware; Integrated circuit technology; Manufacturing processes; Neutrons; Registers; Silicon on insulator technology; Single event transient;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Workshop, 2001. Proceedings. Seventh International
Conference_Location
Taormina
Print_ISBN
0-7695-1290-9
Type
conf
DOI
10.1109/OLT.2001.937838
Filename
937838
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