Title :
Advanced IC fabrication technology using reliable, small-size, and high-speed AlGaAs/GaAs HBTs
Author :
Nittono, T. ; Nagata, K. ; Yamauchi, Y. ; Makimura, T. ; Ito, H. ; Nakajima, O.
Author_Institution :
NTT LSI Labs., Kanagawa, Japan
Abstract :
Reliable, small-size, and high-speed AlGaAs/GaAs HBTs (heterojunction bipolar transistors) have been developed using a carbon-doped thin base layer and O/sup +/-implant E/B (emitter/base) junction isolation. This isolation reduces the recombination current at the implanted edge, resulting in improved current gain. The use of carbon dopant for the base layer improves device reliability. A thin (0.04 mu m) base reduces base transit time, making it possible to achieve a high cutoff frequency of 103 GHz. A one-by-eight static frequency divider and a one-by-four/one-by-five two-modulus prescaler fabricated to investigate circuit performance successfully operated over 10 GHz. The 1- mu m*2.4- mu m emitters used in the divider are the smallest HBT applied to ICs ever reported. This result indicates that the proposed technology is promising for the development of reliable and high-speed HBT ICs.<>
Keywords :
III-V semiconductors; aluminium compounds; bipolar integrated circuits; frequency dividers; gallium arsenide; heterojunction bipolar transistors; integrated circuit technology; ion implantation; scaling circuits; solid-state microwave devices; 10 GHz; 103 GHz; AlGaAs-GaAs; AlGaAs:O/sup +/-GaAs:C; HBTs; IC fabrication technology; base transit time; current gain; cutoff frequency; high-speed HBT ICs; implanted emitter base junction isolation; recombination current; reliability; static frequency divider; two-modulus prescaler; Cutoff frequency; Electrodes; Fabrication; Frequency conversion; Gallium arsenide; Heterojunction bipolar transistors; High speed integrated circuits; Indium tin oxide; Large scale integration; Zinc;
Conference_Titel :
Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-0243-5
DOI :
10.1109/IEDM.1991.235273