• DocumentCode
    3302318
  • Title

    The Copper Surface Defects Inspection System Based on Computer Vision

  • Author

    Wang, Ping ; Zhang, Xuewu ; Mu, Yan ; Wang, Zhihui

  • Author_Institution
    Comput. & Inf. Inst., Hohai Univ., Changzhou
  • Volume
    3
  • fYear
    2008
  • fDate
    18-20 Oct. 2008
  • Firstpage
    535
  • Lastpage
    539
  • Abstract
    The surface defects in copper strips severely affect the quality of copper. So detecting the surface defects in copper strip has great significance to improve the quality. This paper presents a copper strip surface inspection based on computer vision, which uses modularized frame of hardware and the software of image processing. The paper adopts a self-adaptive weight averaging filtering method to preprocess image, and uses the moment invariants to pick the characters of typical defects which eigenvector is identified with the RBF neural networks. Experiments show that the real-time method can effectively detect the copper strip surface defects in the production line.
  • Keywords
    computer vision; computerised instrumentation; copper; copper alloys; inspection; mechanical engineering computing; radial basis function networks; CuJk; RBF neural networks; computer vision; copper strip surface inspection; copper surface defects inspection system; self-adaptive weight averaging filtering method; Cameras; Charge coupled devices; Charge-coupled image sensors; Computer vision; Copper; Filtering; Inspection; Optical filters; Optical scattering; Strips; Copper strips; Hu invariant moments; computer vision; defect inspection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Natural Computation, 2008. ICNC '08. Fourth International Conference on
  • Conference_Location
    Jinan
  • Print_ISBN
    978-0-7695-3304-9
  • Type

    conf

  • DOI
    10.1109/ICNC.2008.273
  • Filename
    4667196