Title :
Polarizing beam splitters using aluminum oxynitride tunnel layers embedded in galium phosphide cube for visible and near-infrared wavelengths
Author_Institution :
Dept. of Electr. Eng., Univ. of New Orleans, New Orleans, LA, USA
Abstract :
Frustrated total internal reflection and optical tunneling at 45° angle of incidence by a symmetric AlOxNy-GaP-AlOxNy trilayer stack of near-half-wavelength total thickness, which is embedded in GaP cube, are tailored to fully transmit the p (TM) polarization and nearly totally reflect the orthogonal s (TE) polarization. Such polarizing beam splitters are suited for red and near-infrared (600 to 1600 nm) wavelengths and have applications for polarization state detection and polarization demultiplexing in lightwave communication systems.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; infrared spectra; light polarisation; light reflection; optical beam splitters; optical multilayers; visible spectra; AlOxNy-GaP-AlOxNy; aluminum oxynitride tunnel layers; frustrated total internal reflection; galium phosphide cube; lightwave communication systems; near-half-wavelength total thickness; near-infrared wavelengths; optical tunneling; orthogonal s TE polarization; p TM polarization; polarization demultiplexing; polarization state detection; polarizing beam splitters; symmetric trilayer stack; visible wavelengths; wavelength 600 nm to 1600 nm; Optical polarization; Optical refraction; Photonics; Tunneling; optical thin films; optical tunneling; polarimetry; polarization demultiplexing; polarizing beam splitters;
Conference_Titel :
High Capacity Optical Networks and Enabling Technologies (HONET), 2011
Conference_Location :
Riyadh
Print_ISBN :
978-1-4577-1170-1
DOI :
10.1109/HONET.2011.6149811
