• DocumentCode
    3302627
  • Title

    Mixed mode double-gate FET model

  • Author

    Solomon, R.M.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    2001
  • fDate
    25-27 June 2001
  • Firstpage
    77
  • Lastpage
    78
  • Abstract
    A general purpose double-gate FET (DGFET) model is presented which is capable of handling a wide variety of DGFET configurations and arbitrary potentials on its four terminals. The heart of the model is the mixed-mode algorithm which, under appropriate bias conditions, transforms the DGFET into two single gate FETs (SGFET) in series. The single gate FET model itself uses a new treatment of the space charge region, allowing the DGFET to be realistically simulated well into the punch-through regime. Sub-threshold and short-channel effects are included and an effective perpendicular electric field, modified by the short-channel charge, is derived for the DGFET and used in mobility calculations. Additional mobility terms can be added to account for scattering at either interface. In addition to currents, voltage dependent capacitances are also derived, including sub-threshold gate to gate capacitances, enabling realistic simulations of coupled circuit noise to be undertaken.
  • Keywords
    carrier mobility; field effect transistors; semiconductor device models; semiconductor device noise; space charge; DGFET; SGFET; coupled circuit noise; effective perpendicular electric field; interface scattering; mixed mode double-gate FET model; mixed-mode algorithm; mobility calculations; punch-through regime; short-channel effects; single gate FETs; space charge region; sub-threshold effects; sub-threshold gate to gate capacitance; voltage dependent capacitance; Capacitance; Circuit simulation; Double-gate FETs; Electrons; Heart; Semiconductor device modeling; Silicon; Space charge; Threshold voltage; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 2001
  • Conference_Location
    Notre Dame, IN, USA
  • Print_ISBN
    0-7803-7014-7
  • Type

    conf

  • DOI
    10.1109/DRC.2001.937880
  • Filename
    937880