DocumentCode :
3303226
Title :
High-temperature operation of mid-infrared (/spl lambda/=4-5 /spl mu/m) vertical and lateral InAs/GaAs/AlGaAs quantum dot infrared photodetectors
Author :
Stiff, A.D. ; Krishna, S. ; Bhattacharya, P. ; Kennerly, S.
Author_Institution :
Solid State Electron. Lab., Michigan Univ., Ann Arbor, MI, USA
fYear :
2001
fDate :
25-27 June 2001
Firstpage :
155
Lastpage :
156
Abstract :
Infrared (IR) detection has sundry applications from military targeting systems to the observation of stellar phenomena to professional photography. It is desirable to develop a high temperature IR photon detection technology, which would lend itself more readily to lightweight, compact, inexpensive IR cameras. Intersubband quantum dot infrared photodetectors (QDIPs) have great promise for providing high-temperature normal incidence operation in the mid- and far-infrared ranges due to the favorable dynamics of hot carriers in quantum dots. In this paper, we present state-of-the-art results on vertical and lateral mid-infrared (λ= 4-5 μm) InAs/GaAs/AlGaAs QDIPs. To our knowledge, the vertical detector we have characterized has the lowest reported dark current for such a device (I/sub dark-vertical/=125 nA at V/sub b/=0.5 V for T=100 K). The lateral detector, which also has an extremely low dark current ( I/sub dark-lateral/=27 pA at V/sub b/=0.5 V for T=100 K), also has one of the highest operating temperatures (100 K) to be reported for such a device.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; high-temperature electronics; indium compounds; infrared detectors; semiconductor quantum dots; 100 K; 125 nA; 27 pA; 4 to 5 micron; IR cameras; InAs-GaAs-AlGaAs; InAs/GaAs/AlGaAs QDIPs; dark current; high-temperature operation; intersubband QDIPs; lateral quantum dot IR photodetectors; mid-infrared photodetectors; vertical quantum dot IR photodetectors; Cameras; Dark current; Hot carriers; Infrared detectors; Photodetectors; Photography; Photonics; Quantum dots; Space technology; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference, 2001
Conference_Location :
Notre Dame, IN, USA
Print_ISBN :
0-7803-7014-7
Type :
conf
DOI :
10.1109/DRC.2001.937911
Filename :
937911
Link To Document :
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