• DocumentCode
    3303443
  • Title

    Hyhope : A Fast Fault Simulator With Efficient Simulation Of Hypertrophic Faults

  • Author

    Kung, Chen-Pin ; Lin, Chen-Shang

  • fYear
    1994
  • fDate
    6-10 Nov 1994
  • Firstpage
    714
  • Lastpage
    718
  • Keywords
    Circuit faults; Circuit simulation; Circuit testing; Degradation; Discrete event simulation; Electrical fault detection; Fault detection; Fault diagnosis; Sequential circuits; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1994., IEEE/ACM International Conference on
  • ISSN
    1063-6757
  • Print_ISBN
    0-8186-3010-8
  • Type

    conf

  • DOI
    10.1109/ICCAD.1994.629901
  • Filename
    629901
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3303443