• DocumentCode
    3303485
  • Title

    The impact of VIIRS polarization sensitivity on ocean color

  • Author

    Kulkarny, V. ; Hauss, B. ; Jackson, J. ; Ip, J. ; Pratt, P. ; Snodgrass, C. ; Tsugawa, R. ; Bendow, B. ; Mineart, G.

  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    220
  • Lastpage
    223
  • Abstract
    The sensitivity to polarized radiance input of the VIIRS instrument (Flight Unit 1 on NPP) has been extensively characterized and shown to be compliant with the sensor specifications [1]. We have rigorously modeled VIIRS measurements of polarized, top-of-atmosphere radiances, using Global Synthetic Data in open ocean regions and a VIIRS sensor model incorporating the polarization sensitivity and other sensor characterization data from thermal vacuum chamber tests. An atmospheric correction over ocean (ACO) algorithm is employed to retrieve the water-leaving radiances, Lw. Analysis of Lw retrieval performance indicates that the impact of polarization on relative errors is significant before any correction and is greatly reduced after the demonstrated correction for effects of polarization. The uncertainty in characterization of VIIRS polarization sensitivity induces errors in retrieved Lw in open oceans that are much smaller than the other errors, which are attributable to the inherent ACO algorithm errors and other sensor errors.
  • Keywords
    atmospheric optics; electromagnetic wave polarisation; oceanographic techniques; oceanography; radiometers; remote sensing; Global Synthetic Data; VIIRS instrument Flight Unit 1; VIIRS polarization sensitivity; atmospheric correction over ocean algorithm; ocean color; polarized radiance input; thermal vacuum chamber tests; top-of-atmosphere radiance; water-leaving radiances; Accuracy; Data models; Image color analysis; Oceans; Sea measurements; Sensitivity; Uncertainty; NPOESS; Ocean Color; Polarization; VIIRS;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
  • Conference_Location
    Honolulu, HI
  • ISSN
    2153-6996
  • Print_ISBN
    978-1-4244-9565-8
  • Electronic_ISBN
    2153-6996
  • Type

    conf

  • DOI
    10.1109/IGARSS.2010.5649719
  • Filename
    5649719