Title :
On-chip testing of embedded programmable logic arrays
Author :
Macii, Enrico ; Wolf, Tara
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA
Abstract :
The authors consider the problems associated with on-chip testing of programmable logic arrays (PLAs) which are deeply embedded in VLSI systems. A detailed summary of the built-in logic block observer (BILBO) approach to embedded PLA testing is given. Then, an innovative method for on-chip testing, which makes use of the input/output registers of the PLA as test aids, is presented. This method is less area-consuming than the traditional BILBO technique
Keywords :
VLSI; built-in self test; integrated circuit testing; logic testing; observers; programmable logic arrays; BILBO; VLSI systems; built-in logic block observer; embedded PLA testing; input/output registers; on-chip testing; programmable logic arrays; Automatic testing; Built-in self-test; Circuit testing; Logic design; Logic testing; Programmable logic arrays; Registers; System testing; Test pattern generators; Very large scale integration;
Conference_Titel :
Communications, Computers and Signal Processing, 1993., IEEE Pacific Rim Conference on
Conference_Location :
Victoria, BC
Print_ISBN :
0-7803-0971-5
DOI :
10.1109/PACRIM.1993.407276
