Title :
Evaluation of total knee arthroplasty from cadaveric specimens
Author :
Levy, M. ; Cross, N. ; Myers, J.
Author_Institution :
Coll. of Osteopathic Med., New England Univ., Biddeford, ME, USA
Abstract :
Analysis of implants from cadaveric specimens can provide valuable information. Factors important to successful total joint arthroplasty include placement, wear, and degradation of the implanted components. This study recorded the alignment, gross surface wear, and embedded debris in bilateral total knee arthroplasties (TKA) retrieved from a cadaveric specimen. The medial-lateral (M-L) mechanical axes were found to lie lateral to the center lines of the tibial articular inserts bilaterally. The tibial articular inserts and patellar components, made from ultra high molecular weight polyethylene (UHMWPE), showed gross signs of pitting and burnishing. The femoral components, made from cast cobalt chrome, showed superficial scratching on each condyle. Background scatter electron microscopy revealed embedded material in the UHMWPE tibial articular inserts
Keywords :
biomechanics; biomedical materials; chromium alloys; cobalt alloys; orthopaedics; polymers; prosthetics; wear; Background scatter electron microscopy; CoCr; UHMWPE tibial articular inserts; alignment; bilateral total knee arthroplasties; burnishing; cadaveric specimens; cast cobalt chrome; condyle; embedded debris; embedded material; femoral components; gross surface wear; implanted components degradation; implants analysis; pitting; superficial scratching; total knee arthroplasty evaluation; ultra high molecular weight polyethylene; Burnishing; Cobalt; Educational institutions; Electron microscopy; Implants; Information analysis; Knee; Mechanical variables measurement; Polyethylene; Scattering;
Conference_Titel :
[Engineering in Medicine and Biology, 1999. 21st Annual Conference and the 1999 Annual Fall Meetring of the Biomedical Engineering Society] BMES/EMBS Conference, 1999. Proceedings of the First Joint
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-5674-8
DOI :
10.1109/IEMBS.1999.803922
