Title :
Two-port calibration of test fixtures with OSL method
Author :
Chen, ZhenYu ; Wang, You Lin ; Liu, Yu ; Zhu, Ning Hua
Author_Institution :
Inst. of Semicond., Acad. Sinica, Beijing, China
Abstract :
The open-short-load (OSL) method is very simple and widely used for one-port test fixture calibration. In this paper, this method is extended to the two-port calibration of test fixtures for the first time. The problem of phase uncertainty arising in this application has been solved. The comparison between our results and those obtained with the short-open-load-thru (SOLT) method shows that the established method is accurate enough for practical applications.
Keywords :
S-parameters; calibration; measurement standards; measurement uncertainty; network analysers; phase measurement; test equipment; two-port networks; OSL method; S parameter measurement; SOLT method; calibration method accuracy; calibration standards; microwave network analyzers; network analyzer test fixtures; one-port test fixture calibration; open-short-load method; phase measurement; phase uncertainty problems; scattering-parameter measurement; short-open-load-thru method; two-port test fixture calibration; Calibration; Content addressable storage; Equations; Fixtures; Integrated optoelectronics; Measurement standards; Microwave measurements; Reflection; Scattering; Semiconductor device testing;
Conference_Titel :
Microwave and Millimeter Wave Technology, 2002. Proceedings. ICMMT 2002. 2002 3rd International Conference on
Print_ISBN :
0-7803-7486-X
DOI :
10.1109/ICMMT.2002.1187654
