Two-port calibration of test fixtures with OSL method

Author

Chen, ZhenYu ; Wang, You Lin ; Liu, Yu ; Zhu, Ning Hua

Author_Institution

Inst. of Semicond., Acad. Sinica, Beijing, China

fYear

2002

fDate

17-19 Aug. 2002

Firstpage

138

Lastpage

141

Abstract

The open-short-load (OSL) method is very simple and widely used for one-port test fixture calibration. In this paper, this method is extended to the two-port calibration of test fixtures for the first time. The problem of phase uncertainty arising in this application has been solved. The comparison between our results and those obtained with the short-open-load-thru (SOLT) method shows that the established method is accurate enough for practical applications.

Keywords

S-parameters; calibration; measurement standards; measurement uncertainty; network analysers; phase measurement; test equipment; two-port networks; OSL method; S parameter measurement; SOLT method; calibration method accuracy; calibration standards; microwave network analyzers; network analyzer test fixtures; one-port test fixture calibration; open-short-load method; phase measurement; phase uncertainty problems; scattering-parameter measurement; short-open-load-thru method; two-port test fixture calibration; Calibration; Content addressable storage; Equations; Fixtures; Integrated optoelectronics; Measurement standards; Microwave measurements; Reflection; Scattering; Semiconductor device testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave and Millimeter Wave Technology, 2002. Proceedings. ICMMT 2002. 2002 3rd International Conference on

Print_ISBN

0-7803-7486-X

Type

conf

DOI

10.1109/ICMMT.2002.1187654

Filename

1187654