Title :
Frequency limitation in calibrating microwave test fixtures
Author :
Qian, Chen ; Wang, You Lin ; Chen, Zhen Yu ; Zhu, Ning Hua
Author_Institution :
Inst. of Semicond., Acad. Sinica, Beijing, China
Abstract :
The problem of frequency limitation arising in calibration of the test fixtures is investigated in this paper. It is found that at some frequencies periodically, the accuracy of the methods becomes very low, and the denominators of the expressions of the required S-parameters approach zero. Thus conclusion can be drawn whether the test fixtures are symmetric or not. A good agreement between theory and experiment is obtained.
Keywords :
S-parameters; calibration; measurement uncertainty; microwave measurement; network analysers; S-parameters; calibration; denominators; frequency limitation; microwave network analyzer; microwave test fixtures; phase uncertainty; scattering-parameter measurement; Calibration; Coaxial components; Equations; Fixtures; Frequency; Measurement standards; Microwave theory and techniques; Reflection; Scattering parameters; Testing;
Conference_Titel :
Microwave and Millimeter Wave Technology, 2002. Proceedings. ICMMT 2002. 2002 3rd International Conference on
Print_ISBN :
0-7803-7486-X
DOI :
10.1109/ICMMT.2002.1187656