• DocumentCode
    3304350
  • Title

    Hall thruster sequencer using Intel-8051 microcontroller for ion thrust measurement

  • Author

    Stephen, R. John ; Raianna, K. ; Hemalatha, M.

  • Author_Institution
    Dept. of Instrum., Indian Inst. of Sci., Bangalore
  • fYear
    2005
  • fDate
    Oct. 30 2005-Nov. 3 2005
  • Abstract
    Hall thrusters, such as stationary plasma thruster (SPT), have been widely used on board modern satellites placed in geo-synchronous orbits for reasons such as orbit maintenance, repositioning and attitude control. In order to study the performance of the stationary plasma thruster, the thrust produced by it has been measured, using a thrust balance with strain gauge sensors under vacuum conditions, by activating the thruster. This activation of thruster has been carried out by switching on and switching off of the necessary power supplies and control of other feed system such as the propellant flow in a particular sequence. Hitherto, these operations were done manually in the required sequence. This paper reports the attempt made to automate the sequential operation of the power supplies and the necessary control valves of the feed system using Intel 8051 microcontroller. This automation has made thrust measurements easier and more sophisticated
  • Keywords
    Hall effect devices; aerospace propulsion; attitude control; microcontrollers; plasma accelerators; velocity measurement; Hall thruster sequencer; Intel-8051 microcontroller; attitude control; control valves; geosynchronous orbits; ion thrust measurement; orbit maintenance; orbit repositioning; power supplies; stationary plasma thruster; strain gauge sensors; thrust balance; Automatic control; Control systems; Extraterrestrial measurements; Feeds; Microcontrollers; Orbits; Plasma measurements; Power supplies; Satellites; Strain measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2005 IEEE
  • Conference_Location
    Irvine, CA
  • Print_ISBN
    0-7803-9056-3
  • Type

    conf

  • DOI
    10.1109/ICSENS.2005.1597822
  • Filename
    1597822