DocumentCode :
3304365
Title :
Choice of calibration equations of the TSM method
Author :
Wang, You Lin ; Chen, Zhen Yu ; Zhu, Ning Hua
Author_Institution :
Inst. of Semicond., Acad. Sinica, Beijing, China
fYear :
2002
fDate :
17-19 Aug. 2002
Firstpage :
150
Lastpage :
153
Abstract :
For the reciprocal test fixtures, there are six independent S-parameters to be determined, and the thru-short-match (TSM) calibration can provide eight calibration equations. In this paper, the relation of calibration equations is investigated. It has been shown that the four equations obtained from the measurement with a transmission standard can be used simultaneously in the calibration. Experimental results show that the different choice of equations will lead to quite different solution, and the calibration accuracy can be improved by taking advantage of the established relation among the calibration equations and properly choosing calibration equations.
Keywords :
S-parameters; calibration; measurement standards; microwave measurement; network analysers; S-parameters; TSM method; calibration accuracy; calibration equations; reciprocal test fixtures; thru-short-match calibration; transmission standard; Calibration; Content addressable storage; Differential equations; Fixtures; Laboratories; Measurement standards; Metalworking machines; Reflection; Scattering parameters; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Millimeter Wave Technology, 2002. Proceedings. ICMMT 2002. 2002 3rd International Conference on
Print_ISBN :
0-7803-7486-X
Type :
conf
DOI :
10.1109/ICMMT.2002.1187657
Filename :
1187657
Link To Document :
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