DocumentCode
3304441
Title
Electrodynamics and controlled spontaneous emission in semiconductor microcavity lasers
Author
Deppe, D.G. ; Lei, C.
Author_Institution
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
fYear
1991
fDate
8-11 Dec. 1991
Firstpage
607
Lastpage
610
Abstract
It is pointed out that controlled spontaneous emission has become a topic of interest and speculation concerning light emission from semiconductors. Recent experiments with GaAs-AlGaAs-InGaAs heterostructures show that such effects are indeed observable, but questions remain as to what role, if any, controlled spontaneous emission may play in current microcavity semiconductor lasers, and in future devices. The authors review the experimental work to date on controlling spontaneous emission in semiconductor microcavities, and present calculations on the microcavity effect on spontaneous emission. In particular, longitudinal cavity effects on the operation of the AlAs-GaAs-InGaAs microcavity Fabry-Perot laser are considered. Cavity enhancement of optical gain is shown to be an immediate benefit of the Fabry-Perot microcavity. The cavity enhancement has been shown to be substantial even for relatively low-contrast DBR (distributed Bragg reflector) mirrors such as occurs with the AlAs-GaAs material.<>
Keywords
III-V semiconductors; aluminium compounds; distributed Bragg reflector lasers; gallium arsenide; indium compounds; laser cavity resonators; semiconductor lasers; superradiance; AlAs-GaAs-InGaAs; DBR lasers; DBR mirrors; Fabry-Perot laser; cavity enhancement; controlled spontaneous emission; distributed Bragg reflector; longitudinal cavity effects; microcavity effect; microcavity semiconductor lasers; operation; semiconductors; Distributed Bragg reflectors; Electrodynamics; Fabry-Perot; Lighting control; Microcavities; Mirrors; Optical control; Semiconductor lasers; Spontaneous emission; Stimulated emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International
Conference_Location
Washington, DC, USA
ISSN
0163-1918
Print_ISBN
0-7803-0243-5
Type
conf
DOI
10.1109/IEDM.1991.235397
Filename
235397
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