Title :
Local origins of sensor activity in 1D oxide nanostructures: from spectromicroscopy to device
Author :
Kolmakov, A. ; Lanke, U. ; Shin, J. ; Jesse, S. ; Kalinin, S.V. ; Karam, R.
Author_Institution :
Dept. of Phys., SIUC, Carbondale, IL
fDate :
Oct. 30 2005-Nov. 3 2005
Abstract :
We have tested a range of imaging techniques to address local transport behavior in the working metal oxide nanostructure sensor. In particular, we were using scanning surface potential microscopy (SSPM) to dc potential distributions in an operating device. We also have successfully implemented of synchrotron radiation based photoelectron emission spectro-microscopy (PEEM) to explore submicron lateral compositional and electronic (work function) inhomogeneousity in individual nanowire sensor. These results open new avenue to visualize the adsorption / desorption phenomena on individual nanostructure both in real time and at nano- and mesoscopic level
Keywords :
atomic force microscopy; nanowires; photoelectron microscopy; photoelectron spectroscopy; sensors; surface potential; synchrotron radiation; 1D metal oxide nanostructure sensor; nanowire sensor; photoelectron emission spectromicroscopy; scanning surface potential microscopy; synchrotron radiation; Chemicals; Electrons; Laboratories; Light sources; Nanobioscience; Nanoscale devices; Photoelectron microscopy; Physics; Pollution measurement; Semiconductor nanostructures;
Conference_Titel :
Sensors, 2005 IEEE
Conference_Location :
Irvine, CA
Print_ISBN :
0-7803-9056-3
DOI :
10.1109/ICSENS.2005.1597828
