Local origins of sensor activity in 1D oxide nanostructures: from spectromicroscopy to device

Author

Kolmakov, A. ; Lanke, U. ; Shin, J. ; Jesse, S. ; Kalinin, S.V. ; Karam, R.

Author_Institution

Dept. of Phys., SIUC, Carbondale, IL

fYear

2005

fDate

Oct. 30 2005-Nov. 3 2005

Abstract

We have tested a range of imaging techniques to address local transport behavior in the working metal oxide nanostructure sensor. In particular, we were using scanning surface potential microscopy (SSPM) to dc potential distributions in an operating device. We also have successfully implemented of synchrotron radiation based photoelectron emission spectro-microscopy (PEEM) to explore submicron lateral compositional and electronic (work function) inhomogeneousity in individual nanowire sensor. These results open new avenue to visualize the adsorption / desorption phenomena on individual nanostructure both in real time and at nano- and mesoscopic level

Keywords

atomic force microscopy; nanowires; photoelectron microscopy; photoelectron spectroscopy; sensors; surface potential; synchrotron radiation; 1D metal oxide nanostructure sensor; nanowire sensor; photoelectron emission spectromicroscopy; scanning surface potential microscopy; synchrotron radiation; Chemicals; Electrons; Laboratories; Light sources; Nanobioscience; Nanoscale devices; Photoelectron microscopy; Physics; Pollution measurement; Semiconductor nanostructures;

fLanguage

English

Publisher

ieee

Conference_Titel

Sensors, 2005 IEEE

Conference_Location

Irvine, CA

Print_ISBN

0-7803-9056-3

Type

conf

DOI

10.1109/ICSENS.2005.1597828

Filename

1597828