Interaction efficiency of an emission gated TWT

Author

Kodis, M.A. ; Freund, H.P. ; Vanderplaats, N.R. ; Zaidman, E.G.

Author_Institution

US Naval Res. Lab., Washington, DC, USA

fYear

1991

fDate

8-11 Dec. 1991

Firstpage

589

Lastpage

592

Abstract

The Emission Gated Device Experiment extracts RF power from a prebunched electron beam passing through a short helix traveling wave circuit. Efficient and compact amplifiers are possible through this approach because of the large component of RF current in a tightly bunched beam. While a wideband, high gain, high power input circuit for such devices is beyond the present state of the art, high transconductance gated field emission cathodes are being developed for emission gated devices. The present experiment is designed to test the performance of the output coupler using a cavity-driven cathode circuit. Twenty percent beam coupling efficiency has been observed from a helix one slow wavelength long.<>

Keywords

microwave amplifiers; travelling-wave-tubes; 20 percent; Emission Gated Device Experiment; beam coupling efficiency; cavity-driven cathode circuit; compact amplifiers; emission gated TWT; gated field emission cathodes; helix traveling wave circuit; high transconductance cathodes; output coupler; prebunched electron beam; short helix; slow-wave devices; tightly bunched beam; Broadband amplifiers; Cathodes; Circuit testing; Coupling circuits; Electron beams; Optical coupling; Radio frequency; Radiofrequency amplifiers; Transconductance; Wideband;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International

Conference_Location

Washington, DC, USA

ISSN

0163-1918

Print_ISBN

0-7803-0243-5

Type

conf

DOI

10.1109/IEDM.1991.235401

Filename

235401