DocumentCode :
3304529
Title :
Interaction efficiency of an emission gated TWT
Author :
Kodis, M.A. ; Freund, H.P. ; Vanderplaats, N.R. ; Zaidman, E.G.
Author_Institution :
US Naval Res. Lab., Washington, DC, USA
fYear :
1991
fDate :
8-11 Dec. 1991
Firstpage :
589
Lastpage :
592
Abstract :
The Emission Gated Device Experiment extracts RF power from a prebunched electron beam passing through a short helix traveling wave circuit. Efficient and compact amplifiers are possible through this approach because of the large component of RF current in a tightly bunched beam. While a wideband, high gain, high power input circuit for such devices is beyond the present state of the art, high transconductance gated field emission cathodes are being developed for emission gated devices. The present experiment is designed to test the performance of the output coupler using a cavity-driven cathode circuit. Twenty percent beam coupling efficiency has been observed from a helix one slow wavelength long.<>
Keywords :
microwave amplifiers; travelling-wave-tubes; 20 percent; Emission Gated Device Experiment; beam coupling efficiency; cavity-driven cathode circuit; compact amplifiers; emission gated TWT; gated field emission cathodes; helix traveling wave circuit; high transconductance cathodes; output coupler; prebunched electron beam; short helix; slow-wave devices; tightly bunched beam; Broadband amplifiers; Cathodes; Circuit testing; Coupling circuits; Electron beams; Optical coupling; Radio frequency; Radiofrequency amplifiers; Transconductance; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International
Conference_Location :
Washington, DC, USA
ISSN :
0163-1918
Print_ISBN :
0-7803-0243-5
Type :
conf
DOI :
10.1109/IEDM.1991.235401
Filename :
235401
Link To Document :
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