Title :
Study on grid emission of microwave power tubes
Author :
Xiaoxia, Wang ; Xianheng, Liao ; Jirun, Luo ; Zhenyong, Guo ; Jizhong, Zhang
Author_Institution :
Inst. of Electron., Acad. Sinica, Beijing, China
Abstract :
An Hf film is coated on the surface of Mo grids by vacuum ion beam aided deposition technology. The SEM, XRD and RBS analysis are performed on the modified Mo grid. Life-span tests of the modified Mo grid are carried out by a diode experiment. When its temperature is kept at 650°C, no electron emission is detected in 1000 hour testing for the electron gun life-span testing. The experimental results have shown that, when the grid is contaminated by an electron emission substance such as Ba from the cathode, the Ba forms a compound with Hf, which effectively suppresses the electron emission of the Mo grid.
Keywords :
Rutherford backscattering; X-ray diffraction; barium; electron emission; electron guns; electron tube testing; hafnium; impurities; life testing; metallic thin films; microwave tubes; molybdenum; scanning electron microscopy; surface contamination; vacuum deposited coatings; 1000 hour; 650 degC; Ba contaminant; Hf; Hf film; Mo; Mo grid surface; RBS analysis; SEM analysis; XRD analysis; contaminated Mo grid; control electrode; electron emission suppression; electron gun life-span testing; grid emission; microwave power tubes; modified Mo grid; vacuum ion beam aided deposition; Cathodes; Diodes; Electron emission; Hafnium; Ion beams; Life testing; Performance analysis; Temperature; Vacuum technology; X-ray scattering;
Conference_Titel :
Microwave and Millimeter Wave Technology, 2002. Proceedings. ICMMT 2002. 2002 3rd International Conference on
Print_ISBN :
0-7803-7486-X
DOI :
10.1109/ICMMT.2002.1187671
