Title :
NEURAL NETWORK ANALYSIS OF IMAGES FOR NON-DESTRUCTIVE EVALUATION
Author :
Sadowsky, John ; Bankman, Isaac ; Sigillito, Vincent
Keywords :
Image analysis; Image coding; Inspection; Laboratories; Manufacturing processes; Neural networks; Physics; Springs; Testing; X-ray imaging;
Conference_Titel :
Signals, Systems and Computers, 1990 Conference Record Twenty-Fourth Asilomar Conference on
Print_ISBN :
0-8186-2180-X
DOI :
10.1109/ACSSC.1990.523401
