• DocumentCode
    3304779
  • Title

    An advanced 0.4 mu m BiCMOS technology for high performance ASIC applications

  • Author

    Kirchgessner, J. ; Teplik, J. ; Ilderem, V. ; Morgan, D. ; Parmar, R. ; Wilson, S.R. ; Freeman, J. ; Tracy, C. ; Cosentino, S.

  • Author_Institution
    Motorola Inc., Mesa, AZ, USA
  • fYear
    1991
  • fDate
    8-11 Dec. 1991
  • Firstpage
    97
  • Lastpage
    100
  • Abstract
    An advanced 0.4 mu m BiCMOS technology has been developed for high-performance ASIC (application-specific integrated circuit) applications. The technology consists of a core 3.3 V CMOS process featuring 0.4 mu m effective channel lengths into which a high-performance n-p-n device module has been integrated. The ECL (emitter coupled logic) circuits are designed to operate with a conventional supply voltage of 5.2 V while the CMOS circuits are powered from an internally regulated 3.3 V supply. The n-p-n device features trench isolation and a self-aligned polysilicon emitter-base structure with a 0.4 mu m final emitter width. A peak Ft of 20 GHz and a minimum ECL delay of 41 ps at Ig=300 mu A have been achieved. This technology features silicided polysilicon local interconnection and up to 4 layers of metallization. A 51 mu m/sup 2/ 6T CMOS SRAM cell is available for applications requiring embedded SRAM.<>
  • Keywords
    BiCMOS integrated circuits; application specific integrated circuits; digital integrated circuits; emitter-coupled logic; integrated circuit technology; 0.4 micron; 3.3 V; 5.2 V; ASIC applications; BiCMOS technology; CMOS SRAM cell; application-specific integrated circuit; core 3.3 V CMOS process; effective channel lengths; embedded SRAM; emitter coupled logic; internally regulated 3.3 V supply; minimum ECL delay; multilevel metallisation; self-aligned polysilicon emitter-base structure; silicided polysilicon local interconnection; trench isolation; Application specific integrated circuits; BiCMOS integrated circuits; CMOS logic circuits; CMOS process; CMOS technology; Coupling circuits; Integrated circuit technology; Logic design; Logic devices; Random access memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-0243-5
  • Type

    conf

  • DOI
    10.1109/IEDM.1991.235415
  • Filename
    235415