DocumentCode :
3304911
Title :
Novel 0.2 mu m i-lithography by phase-shifting on the substrate (POST)
Author :
Tabuchi, H. ; Taniguchi, T. ; Moriwaki, H. ; Tanigawa, M. ; Uda, K. ; Sakiyama, K.
Author_Institution :
Sharp Corp., Nara, Japan
fYear :
1991
fDate :
8-11 Dec. 1991
Firstpage :
63
Lastpage :
66
Abstract :
The authors propose a novel i-line lithography by phase-shifting on the substrate (POST). with POST, 0.2 mu m resist patterns have been achieved by using an i-line stepper and conventional masks without phase shifters. It was confirmed that fine patterns were formed by the phase-shifting effect in the resist on the substrate. Simulation suggests that POST has a better resolution than a phase-shifting mask. It has been demonstrated that, with POST, it is possible to define patterns for ULSIs such as the 256 Mbit DRAM by i-line lithography.<>
Keywords :
VLSI; integrated circuit technology; photolithography; 0.2 micron; POST; ULSI fabrication; conventional masks; i-line stepper; i-lithography; megabit DRAM fabrication; phase-shifting; resist patterns; resolution; substrate; Large scale integration; Lithography; Optical device fabrication; Optical materials; Phase shifters; Resists; Shape; Stability; Ultra large scale integration; X-ray lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International
Conference_Location :
Washington, DC, USA
ISSN :
0163-1918
Print_ISBN :
0-7803-0243-5
Type :
conf
DOI :
10.1109/IEDM.1991.235423
Filename :
235423
Link To Document :
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