Title :
Electromagnetic Interference and Electromagnetic Compatibility Test Technology
Author :
Lv, Feng ; Zhao, Hua ; Du, Wenxia ; Jin, Huilong
Abstract :
With the extensive application of electronic equipment, issues from electromagnetic compatibility caused by electromagnetic interference will directly affect the normal operation of the system or equipment. In this paper, the electromagnetic interference on the basis of research and analysis the two typical interference source-- the inverter and microwave ovens, to discuss the mechanism and performance of electromagnetic and microwave radiation, conduction, and in according to the electromagnetic characteristics of different structures, electromagnetic interference and electromagnetic compatibility problems, it proposes some different approaches, through experimental testing, data analysis and comparison to verify the validity of the method, provide a reliable technical basis for resolving the interference of the actual products.
Keywords :
Electromagnetic analysis; Electromagnetic compatibility; Electromagnetic compatibility and interference; Electromagnetic radiation; Electromagnetic radiative interference; Electronic equipment; Microwave devices; Microwave ovens; Microwave theory and techniques; Testing; Electromagnetic Compatibility; ElectromagneticInterference; Inverter; Microwave oven;
Conference_Titel :
Machine Vision and Human-Machine Interface (MVHI), 2010 International Conference on
Conference_Location :
Kaifeng, China
Print_ISBN :
978-1-4244-6595-8
Electronic_ISBN :
978-1-4244-6596-5
DOI :
10.1109/MVHI.2010.36