Title :
Hypercomplex Correlation for Defect Detection
Author_Institution :
Sch. of Comput. Sci. & Eng., Southeast Univ., Nanjing, China
Abstract :
The normalized cross correlation (NCC) has been used extensively in machine vision for industrial inspection, but the traditional NCC suffers from false alarms for a complicated image that contains partial uniform regions. In this paper, new algorithms of hypercomplex correlation are proposed. We set up a color object model in hypercomplex domain, which provides integrated color characteristics of the object. The proposed hypercomplex correlation in color image can effectively alleviate false alarms in defect detection applications.
Keywords :
Color; Computer science; Inspection; Layout; Machine vision; Man machine systems; Mathematics; Pixel; Quaternions; Testing; Defect detection; Hypercomplex Corrlation; Nomalized cross correlation;
Conference_Titel :
Machine Vision and Human-Machine Interface (MVHI), 2010 International Conference on
Conference_Location :
Kaifeng, China
Print_ISBN :
978-1-4244-6595-8
Electronic_ISBN :
978-1-4244-6596-5
DOI :
10.1109/MVHI.2010.210
