• DocumentCode
    3305549
  • Title

    Delta-doped complementary heterostructure FETs with high Y-value pseudomorphic In/sub 1/Ga/sub 1-y/As channels for ultra-low-power digital IC applications

  • Author

    Grider, D.E. ; Ruden, P.P. ; Nohava, J.C. ; Mactaggart, I.R. ; Stronczer, J.J. ; Nohava, T.E. ; Swirhun, S.S.

  • Author_Institution
    Honeywell SRC, Bloomington, MN, USA
  • fYear
    1991
  • fDate
    8-11 Dec. 1991
  • Firstpage
    235
  • Lastpage
    238
  • Abstract
    The authors report on the device and circuit performance of delta-doped complementary heterostructure insulated gate field effect transistors (C-HIGFETs) which make use of a high InAs mole fraction (y-value) pseudomorphic In/sub y/Ga/sub 1-y/As channel along with a sub-channel delta-doped Si layer to adjust the n-HIGFET and p-HIGFET threshold voltages. Results are presented showing that increasing the y value of the In/sub y/Ga/sub 1-y/As channel up to y=0.25 enhances both the n-HIGFET and the p-HIGFET device performance, as evidenced by the high transconductance values (i.e., G/sub m-n/>300 mS/mm and G/sub m-p/>70 mS/mm, respectively) for 1- mu m gate length devices. The authors present results from In/sub y/Ga/sub 1-y/As channel (y=0.25) C-HIGFET ring oscillators with less than 4- mu W/gate standby-power consumption. These C-HIGFET ring oscillators exhibit gate delays as low as 143 ps at a standby-power of 40 mu W/gate and a switching-power-delay product of 250 fJ. The authors also report on the first fully functional delta-doped C-HIGFET 1 K*4 SRAM operating at a 284-MHz clock frequency and consuming only 183 mW.<>
  • Keywords
    III-V semiconductors; SRAM chips; digital integrated circuits; field effect integrated circuits; gallium arsenide; indium compounds; insulated gate field effect transistors; oscillators; 1 micron; 143 ps; 183 mW; 250 fJ; 284 MHz; 4 kbit; 4 muW; C-HIGFET ring oscillators; InAs mole fraction; SRAM; circuit performance; clock frequency; complementary HIGFETs; delta-doped; digital IC; gate delays; gate length; heterostructure insulated gate field effect transistors; pseudomorphic In/sub 1/Ga/sub 1-y/As channels; semiconductors; switching-power-delay product; threshold voltages; transconductance; ultra-low-power; Circuit optimization; Delay; FETs; HEMTs; Insulation; MODFETs; Random access memory; Ring oscillators; Threshold voltage; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-0243-5
  • Type

    conf

  • DOI
    10.1109/IEDM.1991.235459
  • Filename
    235459