Title :
Aperture extrapolation in planar near-field measurement
Author :
Fang, D.G. ; Liu, C. ; Sheng, W.X. ; Xu, J.Z. ; Liu, Z.Y.
Author_Institution :
Sch. of the Electron. Eng. & Photoelectric Technol., Nanying Univ. of Sci. & Technol., Nanjing, China
Abstract :
The implementation of the planar-near-field technique necessitates the measurement on a truncated-plane surface. In some cases, the probe track and carriage of the near-field equipment may not be able to provide sufficient range. To solve this problem, in this paper, the concept of the aperture extrapolation is introduced and verified This extrapolation is carried out through the spectral estimation. The results show the good prospects for application in near-field measurement.
Keywords :
antenna testing; electric field measurement; extrapolation; aperture extrapolation; planar near-field measurement; spectral estimation; truncated-plane surface; Antenna measurements; Apertures; Extrapolation; Length measurement; Microwave measurements; Microwave technology; Millimeter wave measurements; Millimeter wave technology; Probes; Size measurement;
Conference_Titel :
Microwave and Millimeter Wave Technology, 2002. Proceedings. ICMMT 2002. 2002 3rd International Conference on
Print_ISBN :
0-7803-7486-X
DOI :
10.1109/ICMMT.2002.1187755
