Title :
A CMOS front-end IC for fluctuation enhanced sensing
Author :
Sonkusaic, S. ; Kim, Youngbok ; Agarwal, Anuj
Author_Institution :
Dept. of Electr. & Comput. Eng., Tufts Univ., Medford, MA
fDate :
Oct. 30 2005-Nov. 3 2005
Abstract :
Fluctuation enhanced sensing (FES) is newly coined term for a highly sensitive and selective stochastic fingerprinting technique for chemical and biological sensing. FES deals with the characterization and discrimination of sensed analytes using the microscopic fluctuations of the sensor signal around the mean value. The paper demonstrates a low cost, low power CMOS implementation of a front-end for fluctuation enhanced sensing in a TSMC 0.18mu CMOS technology. It consists of a transimpedance amplifier and low pass filter array with 8 distinct cut-off frequencies acting as a coarse on-chip spectrum analyzer for feature extraction within individual frequency band. The gain of the front-end circuit is at least 87dB with a total power consumption of just 1.1mW. The equivalent input current noise level is under 7nARMS
Keywords :
CMOS integrated circuits; amplifiers; biosensors; chemical sensors; electric sensing devices; feature extraction; low-pass filters; low-power electronics; 0.18 micron; 1.1 mW; 87 dB; CMOS front-end IC; biological sensing; chemical sensing; feature extraction; fluctuation enhanced sensing; low pass filter array; on-chip spectrum analyzer; stochastic fingerprinting; transimpedance amplifier; Biosensors; CMOS integrated circuits; CMOS technology; Chemical and biological sensors; Cutoff frequency; Fingerprint recognition; Fluctuations; Microscopy; Signal analysis; Stochastic processes;
Conference_Titel :
Sensors, 2005 IEEE
Conference_Location :
Irvine, CA
Print_ISBN :
0-7803-9056-3
DOI :
10.1109/ICSENS.2005.1597924
