DocumentCode :
3306296
Title :
System Level Modeling of Piezo-Resistive Pressure Sensors Including Technology Data and Parasitic Effects
Author :
Diener, K.H. ; Reitz, S. ; Schneider, P.
Author_Institution :
Div. of Design Autom., Fraunhofer Inst. for Integrated Circuits, Dresden
fYear :
2005
fDate :
Oct. 30 2005-Nov. 3 2005
Firstpage :
1282
Lastpage :
1285
Abstract :
Basically, integrated piezoresistive pressure sensors exhibit parasitic effects that have to be suppressed as necessary. To ensure the proper function of integrated sensing elements design-driven modeling and simulations have to be performed. This kind of modeling and simulation is extremely useful for determining operation characteristics and verifying sensor performance before manufacturing. Thus, the need for test iterations decreases. That is why, cost and time-to-market can be reduced significantly
Keywords :
piezoresistive devices; pressure sensors; semiconductor device models; parasitic effects; piezoresistive pressure sensor; sensor performance; system level modeling; Analytical models; Circuit simulation; Integrated circuit technology; Manufacturing processes; Mechanical sensors; Piezoresistance; Sensor phenomena and characterization; Sensor systems; Stress; Thermomechanical processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2005 IEEE
Conference_Location :
Irvine, CA
Print_ISBN :
0-7803-9056-3
Type :
conf
DOI :
10.1109/ICSENS.2005.1597941
Filename :
1597941
Link To Document :
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