• DocumentCode
    330635
  • Title

    Monte-Carlo Based Optical Proximity Correction For The Half-Tone Phase Shift Mask

  • Author

    Oh, Yong-Ho ; Lee, Jai-Cheol ; Lim, Sungwoo

  • Author_Institution
    Wonkwang University
  • fYear
    1998
  • fDate
    13-16 July 1998
  • Firstpage
    62
  • Lastpage
    63
  • Keywords
    Degradation; Design automation; Image quality; Manufacturing; Physics; Testing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 1998 International
  • Conference_Location
    Kyoungju, South Korea
  • Print_ISBN
    4-930813-83-2
  • Type

    conf

  • DOI
    10.1109/IMNC.1998.729964
  • Filename
    729964