• DocumentCode
    3306824
  • Title

    CCD image sensor degradation by X-ray radiation

  • Author

    Barton, Zdenek ; Vrba, Radimir

  • Author_Institution
    CEDO, Ltd., Brno
  • fYear
    2005
  • fDate
    Oct. 30 2005-Nov. 3 2005
  • Abstract
    High image quality CCD image sensors are needed in many applications. Low noise and high dynamic range are critical parameters required in scientific and industrial applications. In many of the applications, however, the CCD image sensor can be irradiated by a ionizing radiation, as alpha, beta, gamma or X-ray. This paper describes behaviour of low noise, high dynamic range, 1 megapixel frame-transfer CCD FTT1010-M image sensor radiated by X-ray radiation. CCD image sensor driver board with rad-hard components was designed and used during the tests. Results of the investigation are used in system for protein crystalisation study in microgravity
  • Keywords
    CCD image sensors; X-ray effects; CCD image sensors; X-ray radiation; driver boards; frame-transfer CCD FTT1010-M image sensor; protein crystalisation; rad-hard component; Charge coupled devices; Charge-coupled image sensors; Degradation; Dynamic range; Image quality; Image sensors; Ionizing radiation; Radiation hardening; Testing; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2005 IEEE
  • Conference_Location
    Irvine, CA
  • Print_ISBN
    0-7803-9056-3
  • Type

    conf

  • DOI
    10.1109/ICSENS.2005.1597973
  • Filename
    1597973