Title :
Presentation and improvement of an AFM-based system for the measurement of adhesion forces
Author :
Rakotondrabe, Micky ; Rougeot, Patrick
Author_Institution :
Autom. Control & Micro-Mechatron. Syst. Dept. (AS2M Dept.), UFC, Besancon, France
Abstract :
The aim of this paper is the presentation and improvement of an AFM-based system dedicated to measure adhesion forces. Because an AFM-lever presents a high linearity and a high resolution, it can be used to characterize forces that appears between two micro-objects when their relative distance is small. In this paper, an AFM is used to evaluate the adhesion forces versus the distance. Especially, the pull-off and the Van Der Waals forces can be quantified. Unfortunately, the presence of the hysteresis on the piezotube distorts the measurement and makes the whole system imprecise. Hence, a Prandtl-Ishlinskii hysteresis compensator is introduced. To show the efficiency of the improved measurement system, experiments on different materials where performed.
Keywords :
adhesion; force measurement; measurement systems; AFM-based system; Prandtl-Ishlinskii hysteresis compensator; Van Der Waals; adhesion forces measurement; high linearity; high resolution; measurement system; micro-objects; piezotube distorts; Adhesives; Force measurement;
Conference_Titel :
Automation Science and Engineering, 2009. CASE 2009. IEEE International Conference on
Conference_Location :
Bangalore
Print_ISBN :
978-1-4244-4578-3
Electronic_ISBN :
978-1-4244-4579-0
DOI :
10.1109/COASE.2009.5234182