• DocumentCode
    3307031
  • Title

    Selective wet etching for InGaAs/InAlAs/InP heterostructure field-effect transistors

  • Author

    Tong, M. ; Ketterson, A.A. ; Nummila, K. ; Adesida, I. ; Aina, L. ; Mattingly, M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • fYear
    1992
  • fDate
    21-24 April 1992
  • Firstpage
    298
  • Lastpage
    301
  • Abstract
    The etching characteristics of InAlAs, InGaAs, and InP in citric acid/H/sub 2/O/sub 2/ solutions, and their applications to the fabrication of InAlAs/InGaAs/InP MODFETs are reported. High selectivities of up to 500 and 187 were obtained for InGaAs over InP and InAlAs over InP, respectively. Selectivity values ranging from 2.5 to 25 were achieved for InGaAs over InAlAs with citric acid/H/sub 2/O/sub 2/ solution ratio from 10 to 1. The activation energies for these materials and the etch profiles for a InGaAs/InAlAs/InP MODFET structure are reported. Citric acid/H/sub 2/O/sub 2/ solutions of appropriate ratios have been applied to both mesa etching and gate recessing with good results. These solutions may also be extended to the fabrication of InAlAs/InGaAs and InP/InGaAs heterojunction bipolar transistors.<>
  • Keywords
    III-V semiconductors; aluminium compounds; etching; gallium arsenide; heterojunction bipolar transistors; high electron mobility transistors; indium compounds; InAlAs-InGaAs; InGaAs-InAlAs-InP; InGaAs-InP; MODFETs; activation energies; citric acid/H/sub 2/O/sub 2/ solutions; etch profiles; etching characteristics; fabrication; gate recessing; heterojunction bipolar transistors; heterostructure field-effect transistors; mesa etching; selective wet etching; selectivity; Dry etching; Epitaxial layers; Fabrication; Gallium arsenide; HEMTs; Indium compounds; Indium gallium arsenide; Indium phosphide; MODFET integrated circuits; Wet etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1992., Fourth International Conference on
  • Conference_Location
    Newport, RI, USA
  • Print_ISBN
    0-7803-0522-1
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1992.235581
  • Filename
    235581