DocumentCode :
3307058
Title :
Optimalwavelengths for an early identification of Cercospora beticola with Support Vector Machines based on hyperspectral reflection data
Author :
Rumpf, Till ; Römer, Christoph ; Plümer, Lutz ; Mahlein, Anne-Katrin
Author_Institution :
Dept. of Geoinformation, Univ. of Bonn, Bonn, Germany
fYear :
2010
fDate :
25-30 July 2010
Firstpage :
327
Lastpage :
330
Abstract :
Automatic classification of plant diseases at an early stage is vital for precision crop protection. Our aim was to identify sugar beet leaves inoculated with Cercospora beticola before symptoms are visible. Therefore hyperspectral reflection between 400 and 1050 nm was observed. Relevant wavelengths have to be found in order to implement practical sensor systems with reduced development costs. The main contribution of this study is to identify a minimal subset which is sufficient for separating healthy and inoculated leaves. The heuristic of Hall which analyses the relevance of a feature subset considering the intercorrelation among the features was applied. In order to select a good subset in a reasonable amount of time a genetic algorithm was used. This way enabled a subset of only seven out of 462 wavelengths, which nevertheless enabled us to identify low disease severity ≤ 5% with a classification accuracy of 84.3%. Disease severity above 5% was classified with 99.8%.
Keywords :
crops; diseases; feature extraction; genetic algorithms; geophysical image processing; image classification; support vector machines; vegetation mapping; Cercospora beticola; automatic plant diseases classification; disease severity; genetic algorithm; hyperspectral reflection data; image classification; optimal wavelengths; precision crop protection; sugar beet leaves; support vector machines; Accuracy; Diseases; Hyperspectral imaging; Sugar industry; Support vector machines; Training data; Cercospora beticola; Support Vector Machines; feature selection; genetic algorithm; hyperspectral data;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
Conference_Location :
Honolulu, HI
ISSN :
2153-6996
Print_ISBN :
978-1-4244-9565-8
Electronic_ISBN :
2153-6996
Type :
conf
DOI :
10.1109/IGARSS.2010.5649924
Filename :
5649924
Link To Document :
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