Title :
High quality polishing of InP substrates
Author :
Katsura, S. ; Fukui, T. ; Takahashi, Y. ; Takakusaki, M. ; Nakamura, M. ; Oda, O. ; Sugiyama, Y. ; Tacano, M.
Author_Institution :
Nippon Mining Co Ltd., Saitama, Japan
Abstract :
High-quality polishing technologies including cleaning and packaging methods have been developed. The quality of InP substrates thus prepared has been evaluated by MBE (molecular-beam epitaxy) and MOCVD (metal-organic chemical vapor deposition) growth. Epitaxial growth was performed on InP substrates stored for more than two months, without any wet chemical pretreatment before epitaxial growth. Hall measurement results of epitaxial layers were comparable with or better than those obtained for InP substrates treated by conventional wet chemical pretreatment. Silicon and oxygen contaminations at the interface between epitaxial layers and substrates were largely decreased without any pretreatment before epitaxial growth.<>
Keywords :
Hall effect; III-V semiconductors; indium compounds; molecular beam epitaxial growth; packaging; polishing; semiconductor growth; vapour phase epitaxial growth; Hall measurement; InP substrates; MBE; MOCVD; cleaning; contaminations; epitaxial layers; metal-organic chemical vapor deposition; molecular-beam epitaxy; packaging; polishing technologies; Chemical technology; Chemical vapor deposition; Cleaning; Epitaxial growth; Epitaxial layers; Indium phosphide; MOCVD; Molecular beam epitaxial growth; Packaging; Substrates;
Conference_Titel :
Indium Phosphide and Related Materials, 1992., Fourth International Conference on
Conference_Location :
Newport, RI, USA
Print_ISBN :
0-7803-0522-1
DOI :
10.1109/ICIPRM.1992.235587