Title :
ACO-based scheduling of parallel batch processing machines to minimize the total weighted tardiness
Author :
Li, L. ; Qiao, F. ; Wu, Q.D.
Author_Institution :
Sch. of Electron. & Inf. Eng., Tongji Univ., Shanghai, China
Abstract :
This research was motivated by the scheduling problem of parallel batch processing machines located in the diffusion and oxidation areas in a semiconductor wafer fabrication facility (wafer fab). The objective was to minimize the total weighted tardiness (TWT) on parallel batch processing machines which have incompatible job families, dynamic job arrivals, and constraints on the sequence-dependent setup time and the qualification-run requirements of advanced process control. Since the problem is NP-hard, an ant colony optimization (ACO) algorithm was used to achieve a satisfactory solution in a reasonable computation time. Extensive simulation experiments had been studied to demonstrate the effectiveness of the proposed method. The simulation results showed that the proposed ACO algorithm is superior to a modified Apparent Tardiness Cost-Batched Apparent Tardiness Cost rule adapted to dynamic job arrivals for minimizing the TWT. More machines or the bigger capacity, better improvement of the TWT is achieved. In addition, more machines, jobs or recipes require longer computation time, while bigger capacity requires less computation time.
Keywords :
batch processing (industrial); computational complexity; diffusion; minimisation; oxidation; parallel algorithms; process control; scheduling; semiconductor device manufacture; wafer level packaging; ACO-based scheduling; NP-hard problem; ant colony optimization algorithm; diffusion; dynamic job arrival; oxidation; parallel batch processing machine; process control; semiconductor wafer fabrication facility; sequence-dependent setup time; total weighted tardiness minimization; Ant colony optimization; Automation; Computational modeling; Costs; Dynamic scheduling; Fabrication; Genetic algorithms; Ovens; Oxidation; Process control;
Conference_Titel :
Automation Science and Engineering, 2009. CASE 2009. IEEE International Conference on
Conference_Location :
Bangalore
Print_ISBN :
978-1-4244-4578-3
Electronic_ISBN :
978-1-4244-4579-0
DOI :
10.1109/COASE.2009.5234191