• DocumentCode
    3307332
  • Title

    The influence of the substrate on the thermal stability of InGaAs/InGaAsP quantum wells

  • Author

    Glew, R.W. ; Briggs, A.T.R. ; Greene, P.D. ; Allen, E.M.

  • Author_Institution
    BNR Europe Ltd., Harlow, UK
  • fYear
    1992
  • fDate
    21-24 April 1992
  • Firstpage
    234
  • Lastpage
    237
  • Abstract
    The effective band gaps of InGaAs/InGaAsP quantum wells can be modified after growth by interdiffusion at the boundaries between wells and barriers. The rate of interdiffusion is found to depend on the etch pit density (EPD) of the substrate used, with low EPDs leading to the most rapid diffusion and the largest decrease of the photoluminescence peak wavelength. InP substrates selected for their low EPD provide the maximum interdiffusion and hence the poorest control of quantum well properties. It is concluded that laser structures with sharper heterointerfaces and smaller changes of wavelength during heat treatment can be produced by growing on high EPD substrates.<>
  • Keywords
    III-V semiconductors; chemical interdiffusion; energy gap; etching; gallium arsenide; indium compounds; luminescence of inorganic solids; photoluminescence; semiconductor lasers; semiconductor quantum wells; InGaAs-InGaAsP-InP; InP substrates; barriers; effective band gaps; etch pit density; heterointerfaces; interdiffusion; laser structures; photoluminescence peak wavelength; quantum wells; substrate; thermal stability; Etching; Heat treatment; Indium gallium arsenide; Indium phosphide; MOCVD; Photoluminescence; Quantum well devices; Temperature; Thermal stability; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1992., Fourth International Conference on
  • Conference_Location
    Newport, RI, USA
  • Print_ISBN
    0-7803-0522-1
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1992.235596
  • Filename
    235596