DocumentCode :
330743
Title :
Nanofabrication Using Scanning Near-Field Optical Microscopy
Author :
Mitsuoka, Y. ; Nakajima, K. ; Chiba, N. ; Muramatsu, H. ; Ataka, T.
Author_Institution :
Seiko Instruments Inc.
fYear :
1998
fDate :
13-16 July 1998
Firstpage :
279
Lastpage :
280
Keywords :
Apertures; Atom optics; Atomic force microscopy; Lithography; Nanofabrication; Optical films; Optical microscopy; Optical sensors; Probes; Resists;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 1998 International
Conference_Location :
Kyoungju, South Korea
Print_ISBN :
4-930813-83-2
Type :
conf
DOI :
10.1109/IMNC.1998.730081
Filename :
730081
Link To Document :
بازگشت