مرکز منطقه ای اطلاع رساني علوم و فناوري - Measurement Of Secondary Electron Emission Coefficient From MgO Protecting Layer

DocumentCode :

330748

Title :

Measurement Of Secondary Electron Emission Coefficient From MgO Protecting Layer

Author :

Choi, E.H. ; Oh, H.J. ; Kim, Y.G. ; Ko, J.J. ; Cho, T.S. ; Kim, D.I. ; Cho, G.S. ; Kang, S.O.

Author_Institution :

Kwangwoon University

fYear :

1998

fDate :

13-16 July 1998

Firstpage :

288

Lastpage :

290

Keywords :

Acceleration; Anodes; Crystallization; Electron emission; Ion beams; Plasma displays; Plasma measurements; Probes; Protection; Voltage;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Microprocesses and Nanotechnology Conference, 1998 International

Conference_Location :

Kyoungju, South Korea

Print_ISBN :

4-930813-83-2

Type :

conf

DOI :

10.1109/IMNC.1998.730086

Filename :

730086

Link To Document :