DocumentCode :
330765
Title :
Sub-10-nm EB Lithography Using Poly(/spl alpha/-methylstyrene) Resist of Molecular Weight 650
Author :
Manako, S. ; Fujita, J. ; Tanigaki, K. ; Ochiai, Y. ; Nomura, E.
Author_Institution :
NEC Corporation
fYear :
1998
fDate :
13-16 July 1998
Firstpage :
325
Lastpage :
326
Keywords :
Chemicals; Electrons; Fabrication; Laboratories; Lithography; Nanoscale devices; National electric code; Resists; Substrates; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 1998 International
Conference_Location :
Kyoungju, South Korea
Print_ISBN :
4-930813-83-2
Type :
conf
DOI :
10.1109/IMNC.1998.730104
Filename :
730104
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=330765