DocumentCode
330766
Title
Method For Evaluating The Interface Of Semiconductor Heterojunctions Using A Free Electron Laser
Author
Nishi, K. ; Ishizu, A. ; Nagai, A. ; Tomimasu, T.
Author_Institution
Free Electron Laser Research Institute, Inc.
fYear
1998
fDate
13-16 July 1998
Firstpage
327
Lastpage
328
Keywords
Free electron lasers; Gallium arsenide; Heterojunctions; Nanoscale devices; Optical pumping; Photoconductivity; Power lasers; Semiconductor lasers; Wavelength measurement; Zinc compounds;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocesses and Nanotechnology Conference, 1998 International
Conference_Location
Kyoungju, South Korea
Print_ISBN
4-930813-83-2
Type
conf
DOI
10.1109/IMNC.1998.730105
Filename
730105
Link To Document