Failure dynamics of the IGBT during turn-off for unclamped inductive loading conditions

Author

Shen, Chih-Chieh ; Kefner, A.R. ; Berning, David W. ; Bernstein, Joseph B.

Author_Institution

Center for Microelectron. Reliability, Maryland Univ., College Park, MD, USA

Volume

2

fYear

1998

fDate

12-15 Oct. 1998

Firstpage

831

Abstract

The internal failure dynamics of the insulated gate bipolar transistor (IGBT) for unclamped inductive switching (UIS) conditions are studied using simulations and measurements. The UIS measurements are made using a unique, automated nondestructive reverse bias safe operating area (RBSOA) test system. Simulations are performed with an advanced IGBT circuit simulator model for UIS conditions to predict the mechanisms and conditions for failure. It is shown that the conditions for UIS failure and the shape of the anode voltage avalanche sustaining waveforms during turn-off vary with the IGBT temperature, and turn-off current level. Evidence of single and multiple filament formation is presented and supported with both measurements and simulations.

Keywords

failure analysis; insulated gate bipolar transistors; power bipolar transistors; power semiconductor switches; semiconductor device measurement; semiconductor device reliability; semiconductor device testing; IGBT temperature; anode voltage avalanche sustaining waveforms; failure dynamics; insulated gate bipolar transistor; nondestructive test systems; power IGBTs; reverse bias safe operating area; turn-off; turn-off current level; unclamped inductive loading conditions; unclamped inductive switching; Anodes; Area measurement; Automatic testing; Circuit simulation; Circuit testing; Insulated gate bipolar transistors; Nondestructive testing; Predictive models; Shape; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE

Conference_Location

St. Louis, MO, USA

ISSN

0197-2618

Print_ISBN

0-7803-4943-1

Type

conf

DOI

10.1109/IAS.1998.730242

Filename

730242