DocumentCode
330815
Title
Improving the full-bridge phase-shift ZVT converter for failure-free operation under extreme conditions in welding and similar applications
Author
Aigner, Hubert ; Dierberger, Kenneth ; Grafham, Denis
Author_Institution
Fronius Schweissmaschinen KG, Wels-Thalheim, Austria
Volume
2
fYear
1998
fDate
12-15 Oct. 1998
Firstpage
1341
Abstract
Most published material on the popular high power soft-switched full bridge phase-shift converter has focused on its use in telecommunications and similar power supply applications. In such service the load tends to be resistive and nonfluctuating in nature, so published literature, with one notable exception has not probed the behavior of the topology under extreme conditions of near short-circuit or open-circuit load. In arc welding applications, it is relatively commonplace for the converter to function either with a very reduced load, during pauses between welds for example, or with a virtual short-circuit as when an electrode "sticks" to the work piece. This paper identifies a mechanism that induces power MOSFET failure when the converter operates into a short-circuit load, a condition that leads to the MOSFET being turned off while its own intrinsic diode is conducting reverse recovery current at the same time as normal channel current. The fast rising drain-source voltage ramp linked to this attempted turn-off can then induce second-breakdown in the parasitic NPN transistor associated with the MOSFET, in that the device is still full of minority carriers. The physics of this operating mode are examined in detail. Laboratory experiments described establish a correlation between reverse recovery behavior of the intrinsic diode and converter immunity to failure. Circuit techniques to alleviate the failure-inducing stress are also suggested.
Keywords
arc welding; bridge circuits; field effect transistor switches; power MOSFET; power convertors; short-circuit currents; switching circuits; welding equipment; MOSFET turn off; arc welding; converter failure immunity; failure-free operation; failure-inducing stress; fast rising drain-source voltage ramp; full-bridge phase-shift ZVT converter; high power; intrinsic diode; minority carriers; normal channel current; open-circuit load; operating mode; parasitic NPN transistor; power MOSFET failure; reduced load; reverse recovery current conduction; second-breakdown; short-circuit load; soft-switched full bridge phase-shift converter; virtual short-circuit; welding; zero voltage transitions; Bridge circuits; Diodes; Electrodes; MOSFET circuits; Physics; Power MOSFET; Power supplies; Topology; Voltage; Welding;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE
Conference_Location
St. Louis, MO, USA
ISSN
0197-2618
Print_ISBN
0-7803-4943-1
Type
conf
DOI
10.1109/IAS.1998.730318
Filename
730318
Link To Document